CX-005103: Categorical Exclusion Determination

Operation of Zeiss Sigma VP Scanning Electron Microscope (SEM)CX(s) Applied: B3.6Date: 01/12/2011Location(s): Aiken, South CarolinaOffice(s): Savannah River Operations Office

Office of NEPA Policy and Compliance

January 12, 2011
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Operation of Zeiss Sigma VP Scanning Electron Microscope (SEM)
CX(s) Applied: B3.6
Date: 01/12/2011
Location(s): Aiken, South Carolina
Office(s): Savannah River Operations Office

The Zeiss Sigma VP scanning electron microscope (SEM) is used to examine solids for imaging and elemental analysis.

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