Scanned Probe Microscopy Surface Analysis and Sample PreparationCX(s) Applied: B3.6Date: 12/17/2010Location(s): Aiken, South CarolinaOffice(s): Savannah River Operations Office
Office of NEPA Policy and Compliance
December 17, 2010
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Scanned Probe Microscopy Surface Analysis and Sample Preparation
CX(s) Applied: B3.6
Date: 12/17/2010
Location(s): Aiken, South Carolina
Office(s): Savannah River Operations Office
CX(s) Applied: B3.6
Date: 12/17/2010
Location(s): Aiken, South Carolina
Office(s): Savannah River Operations Office
Scanned probe microscope(s) will be used in Lab 156 for surface and materials analysis. Additionally, sample preparation techniques such as surface and sample modification/deposition and self assembled monolayer formation will be performed. Sample modification/deposition, self-assembled monolayer, and organic thin film formation will involve the generation of chemical solutions of mM (milliMolar) concentrations of organic materials in various organic solvents.