CX-034752: SEM/FIB Operation

The Zeiss Crossbeam 550 focused ion beam (FIB) microscope is used to examine solid samples by electron imaging and x-ray spectroscopy.…

Office of NEPA Policy and Compliance

October 28, 2025
minute read time

The Zeiss Crossbeam 550 focused ion beam (FIB) microscope is used to examine solid samples by electron imaging and x-ray spectroscopy.