CX-033217: Operation of Tescan Scanning Electron Microscope (SEM)

The Tescan MIRA Scanning Electron Microscope (SEM) is used to examine solids for imaging, structural, and elemental analysis. This activity will in…

Office of NEPA Policy and Compliance

February 27, 2025
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The Tescan MIRA Scanning Electron Microscope (SEM) is used to examine solids for imaging, structural, and elemental analysis. This activity will include initial installation, training, and operation of the SEM.