The Tescan MIRA Scanning Electron Microscope (SEM) is used to examine solids for imaging, structural, and elemental analysis. This activity will in…
Office of NEPA Policy and Compliance
February 27, 2025
Estimated Read Time min
The Tescan MIRA Scanning Electron Microscope (SEM) is used to examine solids for imaging, structural, and elemental analysis. This activity will include initial installation, training, and operation of the SEM.