CX-017342: Contained Scanning Electron Microscope, C-134/138, Building 773-A

Categorical Exclusion Determination

Office of NEPA Policy and Compliance

September 28, 2017
Estimated Read Time   min

The method Contained Scanning Electron Microscope outfitted with an energy dispersive x-ray system and other accessories is used to examine dry solids for imaging and elemental analysis.