The JEOL JSM-6460LV Scanning Electron Microscope (SEM), along with all peripheral attachments, are to be removed and replaced with a new SEM. The n…
Office of NEPA Policy and Compliance
February 17, 2026
Estimated Read Time min
The JEOL JSM-6460LV Scanning Electron Microscope (SEM), along with all peripheral attachments, are to be removed and replaced with a new SEM. The new SEM, with needed attachments and accessories, will fit into the existing laboratory floor space in the Inert Metallurgical Laboratory (IML) in Building 234-H and will be placed in proximity to the current SEM's location.