The method Contained Scanning Electron Microscope, (CSEM) outfitted with an energy dispersive x-ray system and other accessories, is used to examin…
Office of NEPA Policy and Compliance
February 27, 2025
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The method Contained Scanning Electron Microscope, (CSEM) outfitted with an energy dispersive x-ray system and other accessories, is used to examine dry solids for imaging and elemental analysis.