CX-004989: Categorical Exclusion Determination

Analytical Physics - Scanning Electron Microscope (SEM)CX(s) Applied: B3.6Date: 01/12/2011Location(s): Albany, OregonOffice(s): Fossil Energy, National Energy Technology Laboratory

Office of NEPA Policy and Compliance

January 12, 2011
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Analytical Physics - Scanning Electron Microscope (SEM)
CX(s) Applied: B3.6
Date: 01/12/2011
Location(s): Albany, Oregon
Office(s): Fossil Energy, National Energy Technology Laboratory

The scanning electron microscopes are used to characterize the microstructure and microchemistry of research materials. Metals, intermetallics, ceramics and composites are analyzed.

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