CX-002207: Categorical Exclusion Determination

Thin Films for Whisker GrowthCX(s) Applied: B3.6Date: 04/16/2010Location(s): Aiken, South CarolinaOffice(s): Environmental Management, Savannah River Operations Office

Office of NEPA Policy and Compliance

April 16, 2010
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Thin Films for Whisker Growth
CX(s) Applied: B3.6
Date: 04/16/2010
Location(s): Aiken, South Carolina
Office(s): Environmental Management, Savannah River Operations Office

Thin films of industrial available low melting point metals and metal alloys (e.g. SAC 305, SAC 105, SnBi58 (Tin-Bismuth), SnPb (Tin-Lead)) will be deposited onto foils or plates of metals (e.g. Aluminum, Copper, Alloy 42). Each sample will be 0.5x2.0 inches with a 10 micron thick coating of the low melting point metal. The samples will be run through multiple characterization tests including Sable systems oxygen analyzer, laser curvature, and x-ray diffraction to test for the amount of oxygen absorbed by the samples, the degree of deflection, and structural changes. The samples will not be exposed to chemicals and will not be in an contaminated environment. Upon completion of the project, samples will be disposed of along with normal laboratory trash.

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