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NLR’s catalyst synthesis capabilities include a variety of approaches, including spontaneous galvanic displacement, direct deposition, atomic layer deposition, and chemical vapor deposition.

The thin film capabilities include combinatorial synthesis, spatially-resolved characterization, and semi-automated data analysis for thin film materials.

This capability supports the application of DOE's H2A (Hydrogen Analysis) and H2FAST (Hydrogen Financial Analysis Scenario Tool) analysis tools.

This capability involves performing modifications to surfaces to overcome inherent poor stability or insufficient catalysis of either photoelectrochemical (PEC) or low-temperature electrolysis (LTE) materials.

The NLR surface analysis cluster tool integrates deposition, processing, and characterization capabilities with an ultrahigh vacuum sample transfer system.

Secondary ion mass spectrometry (SIMS) is a powerful analytical technique useful for measurements of organic surfaces, dopants and impurities in solids, and diffusion across interfaces.

These capabilities can be extended to support membrane production from both proton exchange and anion exchange polymers developed by other scientists for use in electrolysis membrane electrode assemblies.