Photo
Caption
Low-temperature, ultra-high-vacuum, combined atomic force microscope / scanning tunneling microscope at UCLA.
Credit
UCLA
Photo
Caption
Atomic force microscope.
Credit
nano.gov
Photo
Caption
Inventors of the scanning tunneling microscope, Gerd Binnig and Heinrich Rohrer, who won a Nobel Prize for their technology.
Credit
nano.gov
Photo
Caption
A transmission electron microscope from the 1970s.
Credit
Deutsche Fotothek
Photo
Caption
The first scanning electron microscope.
Credit
www.ardenne.de/med
Photo
Caption
Low-temperature, ultra-high-vacuum, combined atomic force microscope / scanning tunneling microscope at UCLA.
Credit
UCLA
Low-temperature, ultra-high-vacuum, combined atomic force microscope / scanning tunneling microscope at UCLA.
UCLA
May 11, 2025