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The NLR surface analysis cluster tool integrates deposition, processing, and characterization capabilities with an ultrahigh vacuum sample transfer system.

Secondary ion mass spectrometry (SIMS) is a powerful analytical technique useful for measurements of organic surfaces, dopants and impurities in solids, and diffusion across interfaces.

These capabilities can be extended to support membrane production from both proton exchange and anion exchange polymers developed by other scientists for use in electrolysis membrane electrode assemblies.

This capability develops computational tools to enable the implementation of materials into a component design for assessing their performance, lifetime, and reliability through high-fidelity modeling methods.

Catalyst ink and ionomer dispersion formulation, high-throughput fabrication, and scaling studies are recognized core competencies at the National Laboratory of the Rockies.

Electrolyzer research needs ex-situ and in-situ characterization of materials and devices, in addition to synthesis of novel advanced material sets.

This capability makes available experts in the design and growth of complex high-performance III-V semiconductor epitaxial structures and optoelectronic devices, combined with the metal-organic vapor-phase epitaxy (MOVPE) tools.

The CIGS team at NLR has the ability to grow high-quality I-III-VI compound semiconductors for photovoltaic as well as PEC applications. The typical I-III-VI chalcopyrite material is Cu(In,Ga)Se2 (or CIGS).

The hybrid organic inorganic perovskite (HOIP) team at NREL has the ability to grow high-quality hybrid perovskites for various solar conversion and optoelectronic applications.

NLR's solar furnace is ideally suited for small-scale feasibility studies. It is available for on-sun functional component performance testing and materials testing for photo-electrochemical (PEC) cell and STCH solar receiver.